1CHAPTER 1 Introduction to Transmission Electron Microscopy
246.1 Energy-Dispersive X-ray Spectroscopy (EDS)
21.1 Historical Overview
256.2 Electron Energy Loss Spectroscopy (EELS)
31.2 Basic Principles of Electron Microscopy
266.3 Electron Diffraction Techniques
41.3 Advantages and Limitations of Transmission Electron Microscopy
27CHAPTER 7 Applications of Transmission Electron Microscopy
5CHAPTER 2 Instrumentation and Components
287.1 Nanomaterial Characterization
62.1 Electron Sources
297.2 Biological Imaging and Cell Biology
72.2 Electron Lenses and Optical Systems
307.3 Materials Science and Semiconductor Analysis
82.3 Specimen Holders and Stage Mechanisms
317.4 Electron Crystallography and Structural Biology
92.4 Detectors and Imaging Systems
32CHAPTER 8 Advanced Topics and Emerging Trends
10CHAPTER 3 Electron-Specimen Interactions
338.1 Aberration-Corrected Transmission Electron Microscopy
113.1 Elastic and Inelastic Scattering
348.2 In Situ Transmission Electron Microscopy
123.2 Diffraction and Image Formation
358.3 Cryo-Transmission Electron Microscopy (Cryo-TEM)
133.3 Contrast Mechanisms in Transmission Electron Microscopy
368.4 Three-Dimensional Electron Microscopy Techniques
14CHAPTER 4 Sample Preparation Techniques
37CHAPTER 9 Practical Considerations and Troubleshooting
154.1 Biological Specimens
389.1 Instrument Alignment and Calibration
164.2 Material Science Samples
399.2 Sample Artifacts and Contamination
174.3 Electron Transparent Specimen Preparation
409.3 Common Issues in Transmission Electron Microscopy
18CHAPTER 5 Imaging Modes and Techniques
41CHAPTER 10 Future Directions and Challenges
195.1 Bright-field Imaging
4210.1 Advances in Detector Technology
205.2 Dark-field Imaging
4310.2 Integration with Computational Methods
215.3 High-Resolution Transmission Electron Microscopy (HRTEM)
4410.3 Multimodal and Correlative Microscopy Approaches
225.4 Scanning Transmission Electron Microscopy (STEM)
45Glossaries
23CHAPTER 6 Spectroscopy and Analytical Techniques
46Index
